31 Al
13 18
Half life: 644 ms 25
Jp: (3/2,5/2)+
Decay mode: b-
Sn (keV): 7153 25
Sp (keV): 13361 70
Prod. mode: Charged particle reaction
Literature cut-off date: 1-Jun-1990
Author(s): P.M. Endt
ENSDF citation: NP A521,1 (1990)

Decay properties

Mode Branching (%) Q-value (keV)
b- 100 7995 20

Gammas from 31Al (644 ms 25)

Eg (keV) Ig (%) Decay mode
621.8 5 2.4 4 b-
752.42 11 5.2 11 b-
1564.3 5 4.2 8 b-
1694.93 19 10.4 22 b-
2316.7 5 18 4 b-

X-rays from 31Al (644 ms 25)

E (keV) I (%) Assignment
0,100 3.1E-07 17 Si Lb1
0,146 1.7E-08 9 Si Lb4
0,146 2.7E-08 15 Si Lb3
1,739 0.00033 13 Si Ka2
1,740 0.0007 3 Si Ka1
1,836 3.9E-06 11 Si Kb3
1,836 7.7E-06 21 Si Kb1

Betas from 31Al (644 ms 25)

>Eb endpoint (keV) Ib (%) Decay mode
5678,2 26 6 b-
6300,02 8 3 b-
7242,57 1 2 b-
7995 65 7 b-