32 Al
13 19
Half life: 33 ms 4
Jp: 1+
Decay mode: b-
Sn (keV): 4179 89
Sp (keV): 1.514E4 12
Literature cut-off date: 1-Jun-1990
Author(s): P.M. Endt
ENSDF citation: NP A521,1 (1990)

Decay properties

Mode Branching (%) Q-value (keV)
b- 100 13019 87

Gammas from 32Al (33 ms 4)

Eg (keV) Ig (%) Decay mode
1941.4 3 13.0 9 b-
2289.2 9 1.4 4 b-
3042.3 4 4.7 7 b-
3843.9 17 1.3 4 b-
4230.4 9 1.8 4 b-

X-rays from 32Al (33 ms 4)

E (keV) I (%) Assignment
0,100 8E-08 7 Si Lb1
0,146 3E-09 3 Si Lb4
0,146 5E-09 5 Si Lb3
1,690 2.3E-10 23 Si Ka3
1,739 0.03 3 Si Ka2
1,740 0.05 5 Si Ka1
1,836 4E-07 3 Si Kb3
1,836 8E-07 7 Si Kb1

Betas from 32Al (33 ms 4)

>Eb endpoint (keV) Ib (%) Decay mode
7234,3 1.3 4 b-
8036 4.7 7 b-
8789,2 3.3 5 b-
11078,5 5.7 13 b-
13020 85 5 b-