20 O
8 12
Half life: 13.51 s 5
Jp: 0+
Decay mode: b-
Sn (keV): 7608 3
Sp (keV): 19353 16
Prod. mode: Charged particle reaction
Literature cut-off date: 21-Apr-1997
Author(s): D. Tilley, C. Cheves, J. Kelley, S. Raman, and H. Weller
ENSDF citation: NP A636, 249 (1998)

Decay properties

Mode Branching (%) Q-value (keV)
b- 100 3814.3 12

Gammas from 20O (13.51 s 5)

Eg (keV) Ig (%) Decay mode
1056.818 4 99.979 2 b-
1309.29 5 0.0022 6 b-
1644.45 10 0.0019 6 b-
1843.88 8 0.0019 6 b-
2179.02 8 0.0022 6 b-
2431.48 6 0.0059 13 b-
3488.16 6 0.017 2 b-

X-rays from 20O (13.51 s 5)

E (keV) I (%) Assignment
0,677 2.0E-05 8 F Ka2
0,677 4.1E-05 16 F Ka1

Betas from 20O (13.51 s 5)

>Eb endpoint (keV) Ib (%) Decay mode
325,81 0.027 3 b-
2757,45 99.973 3 b-